Analytical Techniques for the Characterization of Compound Semiconductors

Analytical Techniques for the Characterization of Compound Semiconductors

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This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques

Analytical Techniques for the Characterization of Compound Semiconductors

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Characterization in Compound Semiconductor Processing

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Compound semiconductors such as Gallium Arsenide, Gallium Aluminum Arsenide, and Indium Phosphide are often difficult to characterize and present a variety of c

Semiconductor Materials Analysis and Fabrication Process Control

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There is a growing awareness that the successful implementation of novel material systems and technology steps in the fabrication of microelectronic and optoele

C, H, N and O in Si and Characterization and Simulation of Materials and Processes

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Containing over 200 papers, this volume contains the proceedings of two symposia in the E-MRS series. Part I presents a state of the art review of the topic - C