Bias Temperature Instability for Devices and Circuits

Released on by Tibor Grasser
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  • Bias Temperature Instability for Devices and Circuits Book Detail

  • Author : Tibor Grasser
  • Release Date : 2013-10-22
  • Publisher : Springer Science & Business Media
  • Genre : Technology & Engineering
  • Pages : 805
  • ISBN 13 : 1461479096
  • File Size : 84,84 MB
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Bias Temperature Instability for Devices and Circuits by Tibor Grasser PDF Summary

Book Description: This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

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