Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Released on by Sleiman Bou-Sleiman
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  • Built-in-Self-Test and Digital Self-Calibration for RF SoCs Book Detail

  • Author : Sleiman Bou-Sleiman
  • Release Date : 2011-09-23
  • Publisher : Springer Science & Business Media
  • Genre : Technology & Engineering
  • Pages : 106
  • ISBN 13 : 144199548X
  • File Size : 16,16 MB
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs by Sleiman Bou-Sleiman PDF Summary

Book Description: This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

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This book is the inaugural volume in the new Springer series on Learning and Analytics in Intelligent Systems. The series aims at providing, in hard-copy and so