Capacitance Spectroscopy of Semiconductors

Released on by Jian V. Li
preview-18

  • Capacitance Spectroscopy of Semiconductors Book Detail

  • Author : Jian V. Li
  • Release Date : 2018-07-06
  • Publisher : CRC Press
  • Genre : Science
  • Pages : 444
  • ISBN 13 : 1351368451
  • File Size : 87,87 MB
DOWNLOAD BOOK

Capacitance Spectroscopy of Semiconductors by Jian V. Li PDF Summary

Book Description: Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, academia, national institutions, and industry, divided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. The first section establishes the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. The second section reviews the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. The third section details the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. The last section presents the latest advances in capacitance-based electrical characterization aimed at reaching nanometer-scale resolution.

Disclaimer: www.yourbookbest.com does not own Capacitance Spectroscopy of Semiconductors books pdf, neither created or scanned. We just provide the link that is already available on the internet, public domain and in Google Drive. If any way it violates the law or has any issues, then kindly mail us via contact us page to request the removal of the link.

Capacitance Spectroscopy of Semiconductors

Capacitance Spectroscopy of Semiconductors

File Size : 71,71 MB
Total View : 6050 Views
DOWNLOAD

Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the d

Dielectric Spectroscopy of Semiconductors

Dielectric Spectroscopy of Semiconductors

File Size : 39,39 MB
Total View : 8944 Views
DOWNLOAD

Dielectric spectroscopy of semiconductors (DSS) employs dielectric measuring techniques to study delayed electronic transitions in and out of localised energy l