An Introduction to Logic Circuit Testing

Released on by Parag K. Lala
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  • An Introduction to Logic Circuit Testing Book Detail

  • Author : Parag K. Lala
  • Release Date : 2022-06-01
  • Publisher : Springer Nature
  • Genre : Technology & Engineering
  • Pages : 99
  • ISBN 13 : 303179785X
  • File Size : 64,64 MB
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An Introduction to Logic Circuit Testing by Parag K. Lala PDF Summary

Book Description: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

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