IEEE Standard Test Access Port and Boundary-scan Architecture

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  • IEEE Standard Test Access Port and Boundary-scan Architecture Book Detail

  • Author :
  • Release Date : 2001
  • Publisher :
  • Genre : Boundary scan testing
  • Pages : 200
  • ISBN 13 : 9780738129457
  • File Size : 38,38 MB
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IEEE Standard Test Access Port and Boundary-scan Architecture by PDF Summary

Book Description: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that slows rigorous description of the component-specific aspects of such testability features.

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IEEE Std 1149.1-2001

IEEE Std 1149.1-2001

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Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circu