On-Wafer Microwave Measurements and De-embedding

Released on by Errikos Lourandakis
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  • On-Wafer Microwave Measurements and De-embedding Book Detail

  • Author : Errikos Lourandakis
  • Release Date : 2016-07-31
  • Publisher : Artech House
  • Genre : Technology & Engineering
  • Pages : 251
  • ISBN 13 : 1630813710
  • File Size : 82,82 MB
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On-Wafer Microwave Measurements and De-embedding by Errikos Lourandakis PDF Summary

Book Description: This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies. Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.

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Microwave De-embedding

Microwave De-embedding

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This groundbreaking book is the first to give an introduction to microwave de-embedding, showing how it is the cornerstone for waveform engineering. The authors

Microwave De-embedding

Microwave De-embedding

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This chapter aims to describe experimental tools and techniques used for on-wafer millimeter (mm)-wave characterizations of silicon-based devices under the smal

Microwave De-embedding

Microwave De-embedding

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The first chapter is intended primarily for those readers who are new to the de-embedding concept. To serve as a gateway into this fascinating but also challeng

Microwave De-embedding

Microwave De-embedding

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Just as physical microwave measurements must be de-embedded from test fixtures by means of calibration, electromagnetic analysis must likewise be calibrated so