Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Released on by Ronald D Schrimpf
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  • Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Book Detail

  • Author : Ronald D Schrimpf
  • Release Date : 2004-07-29
  • Publisher : World Scientific
  • Genre : Technology & Engineering
  • Pages : 349
  • ISBN 13 : 9814482153
  • File Size : 98,98 MB
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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices by Ronald D Schrimpf PDF Summary

Book Description: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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