Secondary Ion Mass Spectrometry

Released on by Paul van der Heide
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  • Secondary Ion Mass Spectrometry Book Detail

  • Author : Paul van der Heide
  • Release Date : 2014-08-19
  • Publisher : John Wiley & Sons
  • Genre : Science
  • Pages : 412
  • ISBN 13 : 1118916778
  • File Size : 50,50 MB
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Secondary Ion Mass Spectrometry by Paul van der Heide PDF Summary

Book Description: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

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Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry

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Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry

Secondary Ion Mass Spectrometry SIMS III

Secondary Ion Mass Spectrometry SIMS III

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Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest