Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits

Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits

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Assessing Fault Model and Test Quality

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For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The sta

Models in Hardware Testing

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Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the

Test Pattern Generation using Boolean Proof Engines

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In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the

Models in Hardware Testing

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Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the