X-ray Scattering from Semiconductors

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  • X-ray Scattering from Semiconductors Book Detail

  • Author : Paul F. Fewster
  • Release Date : 2000
  • Publisher : World Scientific
  • Genre : Science
  • Pages : 303
  • ISBN 13 : 1860941591
  • File Size : 86,86 MB

X-ray Scattering from Semiconductors by Paul F. Fewster PDF Summary

Book Description: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.

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X-ray Scattering From Semiconductors

X-ray Scattering From Semiconductors

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X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques

X-Ray Scattering from Semiconductors (2n

X-Ray Scattering from Semiconductors (2n

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This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations ca