2016 IEEE 25th Asian Test Symposium

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  • 2016 IEEE 25th Asian Test Symposium Book Detail

  • Author :
  • Release Date : 2016
  • Publisher :
  • Genre : Electronic circuits
  • Pages : 320
  • ISBN 13 :
  • File Size : 41,41 MB

2016 IEEE 25th Asian Test Symposium by PDF Summary

Book Description: Annotation The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.

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2016 IEEE 25th Asian Test Symposium

2016 IEEE 25th Asian Test Symposium

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Annotation The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, t

2016 IEEE 25th Asian Test Symposium (ATS)

2016 IEEE 25th Asian Test Symposium (ATS)

File Size : 90,90 MB
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The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present a

VLSI Design and Test

VLSI Design and Test

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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017

Security and Artificial Intelligence

Security and Artificial Intelligence

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AI has become an emerging technology to assess security and privacy, with many challenges and potential solutions at the algorithm, architecture, and implementa