An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Released on by Sarah Fearn
preview-18

  • An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science Book Detail

  • Author : Sarah Fearn
  • Release Date : 2015-10-16
  • Publisher : Morgan & Claypool Publishers
  • Genre : Technology & Engineering
  • Pages : 67
  • ISBN 13 : 1681740885
  • File Size : 81,81 MB
DOWNLOAD BOOK

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science by Sarah Fearn PDF Summary

Book Description: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Disclaimer: www.yourbookbest.com does not own An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science books pdf, neither created or scanned. We just provide the link that is already available on the internet, public domain and in Google Drive. If any way it violates the law or has any issues, then kindly mail us via contact us page to request the removal of the link.

The Practice of TOF-SIMS

The Practice of TOF-SIMS

File Size : 95,95 MB
Total View : 9854 Views
DOWNLOAD

Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with su

Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry

File Size : 10,10 MB
Total View : 1946 Views
DOWNLOAD

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also

Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry

File Size : 75,75 MB
Total View : 7860 Views
DOWNLOAD

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry

ToF-SIMS

ToF-SIMS

File Size : 46,46 MB
Total View : 2000 Views
DOWNLOAD

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 y