Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon

Released on by Peter Pichler
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  • Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon Book Detail

  • Author : Peter Pichler
  • Release Date : 2012-12-06
  • Publisher : Springer Science & Business Media
  • Genre : Technology & Engineering
  • Pages : 576
  • ISBN 13 : 3709105978
  • File Size : 51,51 MB
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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon by Peter Pichler PDF Summary

Book Description: This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.

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