Test Generation of Crosstalk Delay Faults in VLSI Circuits

Released on by S. Jayanthy
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  • Test Generation of Crosstalk Delay Faults in VLSI Circuits Book Detail

  • Author : S. Jayanthy
  • Release Date : 2018-09-20
  • Publisher : Springer
  • Genre : Technology & Engineering
  • Pages : 161
  • ISBN 13 : 981132493X
  • File Size : 3,3 MB
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Test Generation of Crosstalk Delay Faults in VLSI Circuits by S. Jayanthy PDF Summary

Book Description: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

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Delay Fault Testing for VLSI Circuits

Delay Fault Testing for VLSI Circuits

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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, t