Metrology and Physical Mechanisms in New Generation Ionic Devices

Released on by Umberto Celano
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  • Metrology and Physical Mechanisms in New Generation Ionic Devices Book Detail

  • Author : Umberto Celano
  • Release Date : 2016-06-18
  • Publisher : Springer
  • Genre : Science
  • Pages : 191
  • ISBN 13 : 3319395319
  • File Size : 68,68 MB
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Metrology and Physical Mechanisms in New Generation Ionic Devices by Umberto Celano PDF Summary

Book Description: This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.

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Conductive Atomic Force Microscopy

Conductive Atomic Force Microscopy

File Size : 31,31 MB
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The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscal